Bruker’s Dektak® stylus profilers are the result of over four decades of advances in proprietary technology. They provide repeatable, accurate measurements on varied surfaces, from traditional 2D roughness surface characterisation and step height measurements to advanced 3D mapping and film stress analyses.

Dektak® surface profilers are widely considered a superior solution for measuring thin film thickness, stress, and surface roughness and form in applications ranging from educational research verification to semiconductor process control. More recently, Dektak® systems have served as superior characterisation tools for the growing solar cell market, and have been adopted by many major photovoltaic solar cell manufacturers.

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